Nanonics presents a novel, patented planar, folded-piezo, flexure scanner design that allows simultaneous lateral and axial sample scanning as well as coarse inertial positioning. The ultra-thin package permits the scanner to be incorporated into systems where conventional scan stages would be too bulky. This unique device, developed for Nanonics" near-field scanning optical microscope, is now available as a stand alone addition for all scanning applications.

原创作者：瑞典凯戈纳斯有限公司上海代表处