AFM 100 nano ParcanNano fast atomic force microscope

Brief introduction:

The company takes the global exclusive patent tip technology as the core competitiveness, the technology is derived from the technical University of Ilmernau, Germany, is committed to the active tip technology in the preparation ａnd characterization of micro ａnd nano structure research ａnd development, ａnd the industrialization of related equipment.

NanoMETRONOM is a disruptive new AFM system developed by the company. It uses an active intelligent tip that combines sensors, actuators, ａnd functionalized tips to achieve self-excitation ａnd self-sensing without complex laser calibration, which is a huge improvement over existing AFM laser sensing. The system can achieve high speed ａnd high efficiency characterization of micro ａnd nano structures in atmospheric, liquid ａnd vacuum environments, ａnd the imaging accuracy reaches the limit accuracy of 0.2 nm.

Our products have well-known research customers at home ａnd abroad such as Massachusetts Institute of Technology, Berkeley National Laboratory in California, Delft University ａnd Tsinghua University in the Netherlands, as well as high-end industrial customers such as Samsung in South Korea ａnd ASML in the Netherlands.

Product Features:

. Compatible with atmosphere, vacuum ａnd liquid environment

. Self-excitation ａnd self-sensing intelligent tip

. Fast automatic needle feeding without laser adjustment

. Extremely convenient operation 5 seconds fast needle change

. Ultra-high speed scanning imaging (100 lines/s)

. The scanning area was located by real-time light microscopy

Field of Application:

. Multidomain surface analysis

. Rapid spot inspection in the industrial field

. Wafer surface quality control

. Weak mechanical force detection

. Mass sensor sensor

. Identification by biochemical detection

Product advantage

The AFM 100-stage nanoParcannano high-speed atomic force microscope (AFM) uses an active intelligent needle tip that integrates a sensor, driver, ａnd functional needle tip to achieve self-excitation ａnd self-sensing without complex laser calibration, which is a huge improvement over existing AFM laser sensing. The system can realize high-speed ａnd GX characterization of micro ａnd nano structures in atmospheric, liquid ａnd vacuum environments, ａnd the imaging accuracy reaches the limit accuracy of 0.2 nm.