Gaertner LSE-2A2W 进口椭偏仪

LSE-2A2W Ellipsometer specifications

Model LSE Ellipsometer

Manufactured by Gaertner Scientific, USA


Stokes Ellipsometer LSE Description
The Stokes Ellipsometer LSE is a continuation of an entirely new line of ellipsometers based on the advanced StokesMeter technology - winner of Photonics Spectra ａnd R&D 100 best new products awards.
The LSE model ellipsometer includes data acquisition ａnd analysis software.  An optional Windows based computer with PCI interface is available.
This ellipsometer uses patented StokesMeter technology with no moving parts ａnd no modulators to quickly ａnd accurately determine the complete polarization state of the 6328Å laser measuring beam at a 70° incidence angle. The space-saving design features a small footprint yet it can accommodate large samples up to 300mm wide. The sample stage can be easily moved by hand to measure any point on the sample surface. The sample table includes a manual tilt ａnd table height adjustment which is set using an alignment screen on the computer.
The data acquisition ａnd analysis software, LGEMP, can measure the top layer film thickness ａnd film refractive index on a substrate or on 1, 2, or 3 known bottom layers. The films can be transparent or absorbing. This durable integration of hardware ａnd software is fast ａnd easy to use.
Extremely precise, stable ａnd low cost the model LSE Stokes Ellipsometer represents an excellent value in a basic ellipsometer.
Description of Stokesmeter Technology
This patented device uses no moving parts ａnd no modulators to quickly ａnd accurately determine the complete polarization state of the measuring beam.


The diagram above shows the StokesMeter photopolarimeter for the simultaneous measurement of all four Stokes parameters of light. The light beam, the state of polarization of which is to be determined, strikes, at oblique angles of incidence, three photodetector surfaces in succession, each of which is partially spectrally reflecting ａnd each of which generates an electrical signal proportional to the fraction of the radiation it absorbs. A fourth photodetector is substantially totally light absorptive ａnd detects the remainder of the light. The four outputs thus developed form a 4x1 signal vector I which is linearly related, I=AS, to the input Stokes vector S. Consequently, S is obtained by S=A（-1）I. The 4x4 instrument matrix A must be nonsingular, which requires that the planes of incidence for the first three detector surfaces are all different. For a given arrangement of four detectors, A can either be computed or determined by calibration.
Technological Advantage
The clean, compact StokesMeter replaces a typical rotating analyzer assembly consisting of a drum, prism, encoders, switches, motor ａnd detector ａnd their associated electronics. In addition, the waveplate mechanism on the polarizer arm, is eliminated. This results in a fast, precise, stable no moving parts ellipsometer.
An outstanding feature is the Stokes Ellipsometer's compensation for small changes in angular beam deviation caused by sample out-of-flatness. This permits fast, uninterrupted measurement over the entire wafer surface without the need to pause to correct for focus ａnd tilt. When scanning similar samples, tilt-free, focus-free operation is the obvious benefit.