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ECO 3500 FT-IR Metrology Tool | ||
The ECOTM 3500 features fully automated handling of wafers up to 300 mm. It measures dopant concentration levels in dielectric films (BPSG, PSG, FSG, etc.), hydrogen levels in silicon nitride films, epitaxial film thickness, MEMS device thickness, and substitutional carbon and interstitial oxygen levels in silicon wafers. | ||
Product Detail | ||
Some of the highlights of the tool include:
The ECO 3500 improves upon the proven, low cost of ownership and high reliability of our long-running series of ECO tools. Founded on our base of expertise in FT-IR technology, the ECO 3500 is also at the top of its class in performance. Thermo is committed to offering the most expertise, worldwide support and the best possible tools for FT-IR metrology. The ECO 3500 is another affirmation of this commitment. |